000 00791nam a22002537a 4500
999 _c14793
_d14793
008 210108b ||||| |||| 00| 0 eng d
037 _bPurchase
040 _aLoC CIP
_cMMU
_dDaniel
050 _aQH212.53
_b.S29 2018 C.2
245 _aScanning electron microscopy and X-Ray microanalysis/
250 _a4th
260 _aNew York:
_bSpringer science,
_c2018
300 _axxiii, 550p.:
_bill.:
521 _aIncludes index; appendix
_bbook
600 _aScanning electron microscopy
600 _aX-Ray microanalysis
700 _aJoseph I. Goldstein
700 _aDavid C. Joy
700 _aJohn Henry J. Scott
700 _aNicholas W. M. Ritchie
700 _aJoseph R. Michael
700 _aDale E. Newbury
942 _2lcc
_cSH
_e4TH
_hQH212.53
_k.S29
_m 2018 C.2