Scanning electron microscopy and X-Ray microanalysis/
Contributor(s): Joseph I. Goldstein | David C. Joy | John Henry J. Scott | Nicholas W. M. Ritchie | Joseph R. Michael | Dale E. Newbury.
Material type:
BookPublisher: New York: Springer science, 2018Edition: 4th.Description: xxiii, 550p.: ill.Subject(s): Scanning electron microscopy | X-Ray microanalysis
| Item type | Current location | Home library | Call number | Copy number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|
GENERAL COLLECTION FOR LOAN
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MULTIMEDIA UNIVERSITY LIBRARY | MULTIMEDIA UNIVERSITY LIBRARY | QH212.53 .S29 2018 C.1 (Browse shelf) | C.1 | Available | 120B00453 | ||
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GENERAL COLLECTION FOR LOAN
|
MULTIMEDIA UNIVERSITY LIBRARY | MULTIMEDIA UNIVERSITY LIBRARY | QH212.53 .S29 2018 C.2 (Browse shelf) | C.2 | Available | 120B00451 |
Total holds: 0
Includes index; appendix book
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