Scanning electron microscopy and X-Ray microanalysis/ 

 - 4th 
 - New York:  Springer science,  2018 
 - xxiii, 550p.:  ill.: 
<br/><br/> Includes index; appendix  book 
<br/><br/><label>Source: </label> Purchase 
<br/><br/><label>Subjects--Personal Names: </label><br/>Scanning electron microscopy<br/>X-Ray microanalysis
<br/><br/><label>LC Class. No.: </label>QH212.53  / .S29  2018 C.2